Test and Measurement

    Editor's Choice

    How In-Circuit Tests Ensure PCBA Quality and Reliability

    ELE Times Report -
    Key takeaways: In-circuit tests identify a wide range of common manufacturing defects in printed circuit board assemblies (PCBAs). Keysight's in-circuit test systems have boosted...
    Editor's Choice

    Top 3 products for maximizing efficiency and reliability in automated test equipment

    ELE Times Report -
    Courtesy: Panasonic Panasonic offers Solid-State Relays, Chip Resistors, and Thermal Interface Materials that help maximize efficiency and reliability in Automated Test Equipment applications. This blog...
    Electronics

    Rohde & Schwarz first to achieve TPAC for NTN NB-IoT RF and RRM conformance test...

    ELE Times Report -
    At the recent Conformance Agreement Group (CAG) meeting #78 of the Global Certification Forum (GCF), Rohde & Schwarz verified NTN NB-IoT test cases for...
    Electronics

    Anritsu Introduces Revolutionary Site Master MS2085A and MS2089A Analyzers: A New Era in Field Testing...

    ELE Times Report -
    Anritsu Corporation, a global leader in test and measurement solutions, is excited to unveil its groundbreaking advancements in field testing equipment - the Site...
    Automotive

    Dürr and Rohde & Schwarz collaborate on ADAS/AD functional testing for EOL and PTI

    ELE Times Report -
    Automated and autonomous vehicles, which rely on sensors like cameras and radar, either assist or take over decision-making in traffic situations. Sensors’ proper interaction...
    Electronics

    Rohde & Schwarz presents its test solutions at CCW 2024 that enable a successful migration...

    ELE Times Report -
    TETRA or P25 legacy narrowband technologies no longer meet the connectivity needs of today’s first responders. As mission-critical network requirements grow, broadband connectivity is...
    Editor's Choice

    Field measurements in mobile networks for regulators

    ELE Times Report -
    Field measurements are very valuable to regulators or national regulatory authorities (NRAs), since they provide data required to comply with regulations, investigate customer complaints,...
    Editor's Choice

    Designers lead advances in CT scanning field

    ELE Times Report -
    Courtesy: Avnet When a doctor tells you to get a CT scan, they’re calling on a powerful medical imaging technology for insights only otherwise possible...
    Electronics

    Expanded Semiconductor Assembly and Test Facility Database Tracks OSAT and Integrated Device Manufacturers in 670...

    ELE Times Report -
    New edition of database tracks 33% more facilities and highlights advanced packaging and factory certifications The new edition of the Worldwide Assembly & Test Facility Database expands coverage...
    Electronics

    Rohde & Schwarz and Samsung pave the way for adoption of secure ranging test cases...

    ELE Times Report -
    Rohde & Schwarz and Samsung have collaborated to verify secure ranging test cases for the ultra-wideband (UWB) PHY layer and assess the secure receiver characteristics of devices based on FiRa specifications. There are new test cases specified in the FiRa 2.0...
    Electronics

    Rohde & Schwarz at MWC 2024: T&M solutions for the mobile industry that enable connection...

    ELE Times Report -
    Always at the forefront of technological innovation, Rohde & Schwarz is shaping the future of the mobile industry with its comprehensive range of test...
    Electronics

    ECOI commissions Rohde & Schwarz to benchmark Icelandic mobile network quality with ETSI methodology

    ELE Times Report -
    The Electronic Communications Office of Iceland (ECOI) has selected Rohde & Schwarz mobile network testing to assess and benchmark the performance, coverage and capacity of the...
    Electronics

    Anritsu Collaborates with ASUS to Validate IEEE 802.11be (Wi-Fi 7) 320 MHz RF Performance Testing

    ELE Times Report -
    Wireless Connectivity Test Set MT8862A Enables Flexible and Fast Advanced RF Measurement for Wi-Fi 7 320 MHz Anritsu and ASUS have announced a partnership to...
    News

    Advanced Test and Inspection at NEPCON Japan 2024

    ELE Times Report -
    Test Research, Inc. (TRI), the leading Test and Inspection systems provider for the electronics manufacturing industry, will join NEPCON Japan 2024, held at Tokyo...
    Electronics

    Edge Impulse Fundamentals 7: Live Classification Tool for Real-World Testing

    ELE Times Report -
    Welcome back to our series on Edge Impulse, one of the major players in the world of embedded machine learning specifically designed to provide...
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