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Latest end to end 5G NR Connections to be demonstrated at Workshop in Barcelona

Anritsu Corporation is pleased to announce the demonstration of end to end 5G NR connections at the 24th GTI Workshop in Barcelona from 21st February. The connections have been achieved on Anritsu’s Radio Communication Test Station MT8000A and 5G NR Mobile Device Test Platform ME7834NR.

With its leading edge NSA and SA base-station simulation functionality required for developing 5G chipsets, Anritsu’s MT8000A supports the latest 5G technologies, including 4×4 MIMO to increase data communication speeds in the sub-6 GHz band. For wide band mmWave testing 8CC is also fully supported.

The MT8000A already covers all 5G frequency bands in which the first 5G services will be deployed, including 2.5GHz, 3.5GHz, 4.5GHz in the Frequency range 1 (FR1) together with 28GHz and 39 GHz in the Frequency range 2 (FR2). The MT8000A is a highly flexible test platform optimized for both protocol and RF testing.

The Rapid Test Designer (RTD) software environment delivers an intuitive user interface for creating, executing, and analyzing 5G NSA and SA protocol tests while the complementary RF measurement software suite provides a flexible and efficient RF test environment for developers of 5G NR chipsets and mobile terminals.

The ME7834NR is a test platform for 3GPP-based Protocol Conformance Test (PCT) and Carrier Acceptance Testing (CAT) of mobile devices incorporating Multiple Radio Access Technologies (RAT). It supports 5G NR in both Standalone (SA) and Non-Standalone (NSA) mode, in addition to LTE, LTE-Advanced (LTE-A), LTE-A Pro, and W-CDMA.

When combined with Anritsu’s new OTA chamber MA8171A and RF converters, the ME7834NR covers the sub-6 GHz and millimeter wave (mmWave) 5G frequency bands. The ME7834NR is registered with both the Global Certification Forum (GCF) and PCS Type Certification Review Board (PTCRB) as Test Platform (TP) 251 and is the first to achieve approval for 5G NR Protocol Conformance tests from GCF in the CAG57 meeting.

For more information, visit: www.anritsu.com

 

 

 

ELE Times Research Desk
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