At SPS 2026 in Nuremberg, Rohde & Schwarz and ZES ZIMMER will showcase their combined test and measurement solutions for industrial drives and automation systems. At Booth 4A-464, visitors can see how these solutions help engineers test, validate, optimise and monitor electrical power systems at different stages of development and operation. The technologies are designed to support reliable performance across a wide range of industrial applications.
Rohde & Schwarz will exhibit alongside its subsidiary ZES ZIMMER for the first time at SPS 2026 in Nuremberg. From November 24 to 26, the companies will showcase their combined test and measurement solutions at Booth 4A-464. These solutions are designed to help engineers develop, test, validate and troubleshoot industrial electrical systems more efficiently.
SPS – Smart Production Solutions – covers the full range of smart and digital automation, from sensors and control technology to electrical infrastructure and drive systems. In these applications, reliable automation depends on understanding how electrical systems behave in practice. From diagnosing intermittent faults in production equipment to evaluating drive efficiency and investigating inverter switching behavior, test and measurement provides the evidence engineers need to make informed decisions. At SPS, Rohde & Schwarz and ZES ZIMMER will show how on-site troubleshooting, precision power analysis, and detailed signal analysis work together across development, validation, and operation.
Measure power and evaluate efficiency
A central part of the joint presentation is precision power analysis. Rohde & Schwarz and ZES ZIMMER will demonstrate electric drivetrain efficiency testing with the LMG671 Power Analyzer, which supports continuous power measurement with high precision and wide dynamic range. The analyzer measures overall system output to input efficiency and also captures the motor’s mechanical power through direct speed and torque measurement. Inverter output power can be analyzed in three bandwidths to assess fundamental, narrowband and wideband power. This allows users to examine effects such as harmonics and derive values such as high frequency losses. A dedicated custom menu presents the relevant readings and graphs in one view.
Understand drive and inverter behavior
For engineers working on industrial drives and power converters, the booth will also feature three phase power debugging and testing of drive inverters. With the R&S MXO-K333 three-phase analysis option on the MXO 5 oscilloscope, users can measure RMS, power factor, active and reactive power, efficiency and total harmonic distortion while keeping voltage and current waveforms visible for root cause analysis. This allows development and validation teams to investigate switching faults, imbalance and harmonics under realistic load conditions.
Diagnose faults in production equipment
In production facilities, troubleshooting often requires safe measurements on power lines, drives and control electronics that do not share a common ground. Rohde & Schwarz will show isolated channel measurements with the R&S Scope Rider RTH, which allow technicians to capture floating signals safely at machines and control cabinets. Independently isolated inputs support mixed high and low voltage debugging. Remote access and scripting make it easier to run guided or unattended test sequences in automated cells. This helps speed up fault isolation and supports repeatable verification under real production conditions.
Verify communication and support manufacturing tests
Another part of the exhibit will address serial communication in production and automated test environments. Buses such as I²C, SPI, UART and CAN often carry the control and status information that determines whether a unit passes or fails. Rohde & Schwarz has extended the serial bus trigger and decode functionality on its MXO oscilloscopes to cover Quad SPI and Octo SPI, becoming the first T&M provider to support these higher throughput SPI variants. Users can isolate protocol events such as addresses, data patterns, ACK errors or frame faults instead of relying only on waveform inspection. This approach helps shorten debug cycles and supports repeatable manufacturing tests.
