Rohde & Schwarz presents its latest test and measurement solutions for power electronics systems at PCIM Expo 2026 in Nuremberg. The showcase highlights cutting-edge approaches that address the most demanding challenges of today’s wide-bandgap devices and drivetrain applications. Advance testing and characterisation enable engineers to improve the performance, efficiency and reliability of SiC- and GaN-based power electronics in applications such as AI data centres, renewable energy and e-mobility. At PCIM Expo 2026, Rohde & Schwarz will showcase its latest test and measurement solutions.
“Power electronics are at the core of the energy and mobility transition. With our latest test and measurement solutions, we enable engineers to fully understand, optimise, and validate the performance of next-generation SiC and GaN devices, bringing higher efficiency, reliability and speed to their designs,” says Philipp Weigell, Vice President Market Segment Industry, Components, Research & Universities at Rohde & Schwarz.
3-Phase Analysis for Power and Drives
Rohde & Schwarz introduces the new 3-phase power analysis option (R&S MXO-K333) for the R&SMXO 3, 4, 5/5C series oscilloscopes. This option turns an MXO oscilloscope into the best-in-class waveform analysis tool for in-depth 3-phase AC power characterisation. The solution simplifies total power results, multiphase AC power qualities, harmonic standard testing and distortion measurements, while keeping the original transient waveforms in view for instant root-cause tracing. At the PCIM Expo, visitors can explore how a guided setup wizard maps the eight available channels of the MXO 5 to three voltage and three current probes, validates the wiring (supporting two-wire, three-wire, and four-wire configurations: 2V2A, 3V3A, 3VN3A) and automatically configures the instrument. After the setup is complete, the software delivers per-cycle power calculations, RMS values, power factor, active and reactive power, total power, phasor/vector visualisation and harmonic/THD analysis. All of this is in line with IEC 61000-3-2, and the results are presented with power-waveform views, harmonic spectra, FFT statistics and phasor diagrams. The 3-phase power analysis option provides MXO oscilloscopes with waveform view and trigger capabilities. This enables engineers to see beyond a conventional power analyser’s statistical data, supporting the debugging of power distribution, converters and industrial power systems.
Electric Drivetrain Efficiency
PCIM Expo visitors can also experience the LMG671 power analyser at the Rohde & Schwarz booth, as it demonstrates how to reliably measure efficiency and quantify losses in modern electric drivetrain power electronics. The analyser provides continuous, high-precision power measurement with exceptional dynamic range, delivering output to input efficiency for the drivetrain under test while simultaneously capturing the motor’s mechanical power through direct speed and torque sensing. Inverter output is examined in the three distinct bandwidths, fundamentals, harmonics and wideband power, to extract derived values such as high-frequency losses. All relevant readings and graphs are presented on a dedicated CUSTOM menu, giving users a complete view of the system’s performance at a single glance. The LMG671 is now part of Rohde & Schwarz’s power electronics portfolio, following the recent acquisition of ZES ZIMMER Electronic Systems GmbH.
Double-Pulse Testing of SiC Automotive Power Modules (Hitachi Energy RoadPak)
In another setup, Rohde & Schwarz, together with PE-Systems, showcase an automated double-pulse tester that delivers precise, repeatable measurements while improving consistency and efficiency in power electronics characterisation. The solution provides fast insights into the dynamic switching behaviour of power modules, with automated parameter extraction that reduces human error and accelerates development.
The demo unit is based on the rack-optimised, next-generation MXO58 oscilloscope from Rohde & Schwarz. Leveraging its eight channels in combination with the R&S RT-ZISO isolated probing system, it enables stable and accurate double-pulse testing for SiC and GaN devices in a fully automated environment.
