HomeNewsIndia NewsGet Reliable RF Tests Results at Lower Costs with new NI WLAN...

    Get Reliable RF Tests Results at Lower Costs with new NI WLAN Test Toolkit 17.0

    National Instruments (NI), the platform-based systems provider enabling engineers and scientists to solve the world’s greatest engineering challenges, announced on May 8, 2017the WLAN Test Toolkit 17.0 with support for Draft 1.1 of the IEEE 802.11ax standard. The WLAN Test Toolkit 17.0  is combined with NI’s second-generation Vector Signal Transceiver (VST), and supports 802.11ax waveform generation and analysis for characterisation, validation and production test of products, that implement Draft 1.1 of the IEEE 802.11ax standard such as RF front end components, wireless modules and user devices.

    The WLAN Test Toolkit 17.0 empowers designers and engineers with the ability to generate and analyze a wide range of 802.11ax standard-compliant waveforms, including extended single user, multiuser OFDMA and multiuser multiple input, multiple output (MIMO) with per-user configuration and measurement results. The toolkit helps users solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. Engineers can also use the new software to generate trigger frames to test the real-time response of client devices and make power pre-correction and relative center frequency measurements.

    “As the standardization and evolution of 802.11ax continues, engineers require a software-centric test approach that can keep pace with the latest standard features and the challenging new test cases,” said Charles Schroeder, vice president of RF marketing at NI. “Taking advantage of NI’s modular platform and second-generation VST can help users lower their cost of test and reduce time to market.”

    With the WLAN Test Toolkit 17.0 and second-generation VST, engineers can configure up to 8×8 MIMO systems in a single PXI chassis. Users can also expect EVM measurements better than -50 dB, leading to rigorous device characterization and reliable test results. Furthermore, engineers can control their systems with the toolkit’s generation and analysis soft-front panels, and benefit from extensive LabVIEW, C and .NET system design software APIs and example code when programming and automating their systems.

    With the WLAN Test Toolkit 17.0 NI expands its wide-ranging product portfolio for testing 802.11a/b/g/j/n/p/ac/ax, Bluetooth, 2G, 3G, 4G, FM/RDS, GNSS and low-power Internet of Things (IoT) wireless standards.

    NI’s platform-based approach helps ensure that users can update their existing PXI RF test systems to support 802.11ax device testing with a simple software update, and continue to do so as the 802.11ax standardization process evolves. This gives the engineers an advantage for RF test in lowering testing cost and in proper preparation for future connectivity and cellular standardization initiatives, such as 5G.

    To learn more visit www.ni.com/80211ax/.

    ELE Times Bureau
    ELE Times Bureauhttps://www.eletimes.ai/
    ELE Times provides a comprehensive global coverage of Electronics, Technology and the Market. In addition to providing in depth articles, ELE Times attracts the industry’s largest, qualified and highly engaged audiences, who appreciate our timely, relevant content and popular formats. ELE Times helps you build awareness, drive traffic, communicate your offerings to right audience, generate leads and sell your products better.

    LEAVE A REPLY

    Please enter your comment!
    Please enter your name here

    Related News

    Must Read

    TI’s new power-management solutions enable scalable AI infrastructures

    Texas Instruments (TI) debuted new design resources and power-management...

    ESA awards Rohde & Schwarz for contributions to 30 years European Satellite Navigation

    The event brought together institutional and industrial partners, ESA...

    STMicroelectronics joins FiRa board, strengthening commitment to UWB ecosystem and automotive Digital Key adoption

    STMicroelectronics, a global semiconductor leader serving customers across the...

    STARLight Project chosen as the European consortium to lead in next-gen silicon photonics on 300 mm wafers

    The STARLight project is bringing together a consortium of leading...

    KYOCERA AVX RELEASES NEW KGP SERIES STACKED CAPACITORS

    KYOCERA AVX released the new KGP Series commercial-grade stacked...

    Microchip Unveils First 3 nm PCIe Gen 6 Switch to Power Modern AI Infrastructure

    Switchtec Gen 6 PCIe Fanout Switches deliver extra bandwidth,...

    Nuvoton Launches Arbel NPCM8mnx System-in-Package (SiP) for AI Servers and Datacenter Infrastructure

    Breakthrough BMC Innovation Powers Secure, Scalable, and Open Compute...

    NEPCON ASIA 2025: Showcasing the Future of Smart Electronics Manufacturing

    NEPCON ASIA 2025, taking place from October 28 to...

    Renesas Expands Sensing Portfolio with 3 Magnet-Free IPS ICs & Web-Based Design Tool

    New Simulation & Optimization Platform Enables Custom Coil Designs...

    IEEE IEDM, 2025 Showcases Latest Technologies in Microelectronics, Themed “100 Years of FETs”

    The IEEE International Electron Devices Meeting (IEDM) is considered...