HomeNewsIndia NewsNI helps to Reduced Cost of Designing and Deploying Test Systems with...

    NI helps to Reduced Cost of Designing and Deploying Test Systems with ATE Core Configurations

    NI  the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced on May 24, new ATE Core Configurations which deliver core mechanical, power and safety infrastructure to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive.

    ATE Core Configurations help simplify the design, procurement, assembly, and deployment of smarter test systems at a lower cost and shorter time to market by empowering test organizations with a platform for standardization. These 19-in., rack-based configurations are available in various rack-unit heights, and offer scalable power profiles to match the needs of nearly any application and geography. Test organizations can benefit from highly integrated safety features such as thermal shutoff, emergency power off (EPO), optional uninterruptible power supplies and IEC 61010 certification.

    Key benefits include:

    • Highly customizable – Choose what is included in the system, and where within the rack, including PXI instrumentation, signal conditioning, kW power supplies, cooling and more
    • Streamlined procurement – Simplify bill of materials management with consolidated part numbers and fewer vendor transactions
    • Readily deployable – Benefit from IEC 61010 certified systems which are backed by more than 1,500 NI sales, system and support engineers worldwide
    • Expansive ecosystem – Work directly with NI Alliance Partners to specify a turn-key system, including mass interconnect and fixturing, test software development, system maintenance, lifecycle support and more

    “Building a test system is a difficult job – one that even the best organizations spend many months accomplishing purely because of the number of components, suppliers and interoperability challenges present,” said Luke Schreier, director of automated test product marketing at NI. “The new ATE Core Configurations can help users dramatically simplify the purchasing process for a common set of requirements and reduce the time and cost of building a system. And when you ultimately want a turn-key system, they form a great bridge to the integration expertise of our Alliance Partner Network.”

    ATE Core Configurations also benefit from NI’s high-performance PXI instrumentation and extensive test software portfolio. This includes more than 600 PXI instruments ranging from DC to mmWave featuring high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. ATE Core Configurations can also include TestStand test management software and LabVIEW code module development software, extensive API and example program support for PXI instruments, and more than 13,000 instrument drivers for third-party box instruments.

    For more visit:  www.ni.com/ate-core-configurations.

    ELE Times Bureau
    ELE Times Bureauhttps://www.eletimes.ai/
    ELE Times provides a comprehensive global coverage of Electronics, Technology and the Market. In addition to providing in depth articles, ELE Times attracts the industry’s largest, qualified and highly engaged audiences, who appreciate our timely, relevant content and popular formats. ELE Times helps you build awareness, drive traffic, communicate your offerings to right audience, generate leads and sell your products better.

    Related News

    Must Read

    Posifa Technologies Introduces PVC4001-C MEMS Pirani Vacuum Transducer for Wide-Range Vacuum Measurement

    Posifa Technologies has introduced its new PVC4001-C MEMS Pirani vacuum...

    STMicroelectronics to support AI infrastructure demand with high-volume production of its industry-leading silicon photonics platform

    STMicroelectronics is now entering high-volume production for its state-of-the-art...

    Impact of AI on Computing and the Criticality of Testing

    Courtesy: Teradyne Artificial intelligence (AI) is transforming industries, enhancing our...

    Disruptions from Wide Bandgap Continue Turbulence

    Courtesy: Avnet When we experience major shifts in the technology...

    Securing Humanoid Robotics with TPM-Anchored FPGAs

    Courtesy: Lattice Semiconductor The humanoid robotics market is rapidly transitioning...

    Keysight Expands Digital‑Layer Error Performance Validation for High‑Speed 1.6T Interconnects in AI Data Centres

    Keysight Technologies, Inc. introduced the Functional Interconnect Test Solutions (FITS) portfolio...

    CEA-Leti and NcodiN Collaborate on 300 mm Silicon Photonics for Bandwidth-Consuming AI Interconnects

    CEA-Leti and NcodiN, a French deep-tech startup pioneering nanolaser-enabled...

    How good are ultra-low bitrate speech codecs?

    Courtesy: Rhode and Schwarz Quality Evaluation of Speech Coding Technologies A...

    NXP CoreRide Puts Automakers on Fast Path to 48 V Scalable Zonal Architectures

    NXP Semiconductors introduced its NXP CoreRide Z248 zonal reference...