HomeNewsIndia NewsNI Introduces 3GPP-Compliant Reference Test Solution for Sub-6 GHz 5G New Radio

    NI Introduces 3GPP-Compliant Reference Test Solution for Sub-6 GHz 5G New Radio

    NI announced a sub-6 GHz 5G test reference solution compliant with the 3GPP Release 15 specification for 5G New Radio (NR).

    With commercial 5G NR deployments below 6 GHz on the horizon, engineers are actively developing sub-6 GHz 5G RF components and devices. The accelerated pace of 5G standardization is driving intense pressure to bring products to market quickly. NI’s sub-6 GHz 5G NR reference solution is a cost-effective and high-performance option for test that helps engineers quickly characterize their designs and more easily transition from R&D to production test environments.

    The new reference test solution from NI is well-suited for testing new wideband RFICs, especially those operating in the 3.3 – 4.2 GHz and 4.4 – 5.0 GHz bands. Engineers can test devices operating with 400 MHz of continuous signal bandwidth and beyond with the PXIe-5840 Vector Signal Transceiver (VST), which includes 1 GHz of instantaneous signal generation and analysis bandwidth up to 6 GHz. With the NI VST, the solution delivers residual EVM performance better than 0.32 percent (-50 dB) for 100 MHz NR signals along with faster measurement speed.

    A critical component of this solution is NI-RFmx NR measurement software, which has evolved in conjunction with the 3GPP specification. The latest version of NI-RFmx NR measurement software offers 5G NR waveforms and measurement capability compliant with the first official specification of 3GPP Release 15 for non-standalone NR, which empowers engineers to test both OFDMA and DFT-s-OFDM carrier aggregated waveforms with flexible subcarrier spacing from 15 kHz to 120 kHz.

    “Our new offerings for 5G test are just the latest in a long line of NI innovations helping engineers bring 5G technologies to market more quickly,” said Jason White, director of RF and wireless test at NI. “By combining high-performance RF measurement capability with extremely fast and flexible measurement software, we are helping engineers reduce time-to-market and measurement correlation time by reusing the same instrumentation and measurement science in multiple phases of product development.”

    NI’s new technology for 5G test also supplements a comprehensive product portfolio for RF and semiconductor test, including measurement software for 2G, 3G, LTE-Advanced Pro, WiFi 802.11ax, Bluetooth 5 and more. In addition, engineers can use the NI VST alongside more than 600 modular PXI products, spanning DC to mmWave, to create comprehensive semiconductor characterization and manufacturing test systems.

    To learn more about the 5G NR standard and NI solutions, visit ni.com/5g.

    ELE Times Research Desk
    ELE Times Research Deskhttps://www.eletimes.ai
    ELE Times provides a comprehensive global coverage of Electronics, Technology and the Market. In addition to providing in depth articles, ELE Times attracts the industry’s largest, qualified and highly engaged audiences, who appreciate our timely, relevant content and popular formats. ELE Times helps you build awareness, drive traffic, communicate your offerings to right audience, generate leads and sell your products better.

    Related News

    Must Read

    Keysight to Demonstrate NR-NTN devices Mobility Testing at MWC 2026 in Collaboration with Samsung

    Keysight Technologies, Inc. will demonstrate lab-based validation of new...

    ROHM Strengthens Supply Capability for GaN Power Devices

    Combining TSMC’s Process Technology to Build an End-to-End, In-Group...

    element14 Community launches smart security and surveillance design challenge

    element14, an Avnet Community, in collaboration with ADI, has...

    R & S and LITEON demonstrate high‑throughput 5G femtocell testing with the PVT360A

    Rohde & Schwarz and LITEON collaborate to showcase a...

    Infineon presents MCU and sensor solutions for the future of AI, IoT, mobility, and robotics

    Next-generation embedded systems are essential for applications in the...

    R&S advances AI-RAN testing using digital twins in collaboration with NVIDIA

    Rohde & Schwarz will showcase a new milestone in...

    Top Seven Tech Trends in the semiconductor sector for 2026

    By: STMicroelectronics In 2026, a new class of intelligent machines...