HomeNewsIndia NewsRohde & Schwarz and IHP first to characterize D-band frequencies in over-the-air...

    Rohde & Schwarz and IHP first to characterize D-band frequencies in over-the-air test setup for 6G and automotive radar

    Academia and key industry players have identified the D-Band, ranging from 110 GHz to 170 GHz, as a candidate frequency band for beyond 5G and 6G mobile communications as well as for future automotive radar applications. Rohde & Schwarz continues its pioneering sub-THz research efforts with focus in this frequency range, reaching new milestones. In collaboration with IHP, Rohde & Schwarz has performed the industry’s first full 2D/3D antenna characterization of transceiver modules operating in the D-Band.

    Similar to 5G networks and devices supporting mmWave frequencies, antenna systems and RF transceiver modules for future mobile communications standards or automotive radar applications will share the same features that make their testing a challenge. Their wide frequency range, a greater number of antenna elements and the lack of conventional external RF connectors will demand testing over-the-air in a shielded environment. Wireless communications test expert Rohde & Schwarz and IHP GmbH (Innovations for High Performance Microelectronics) have transferred this test method successfully into sub-THz range: They demonstrated the first full 2D/3D over-the-air measurements of a radar module at D-Band frequencies.

    The test setup consists of the R&S ATS1000 antenna test system, the R&S ZNA43 vector network analyzer and the R&S AMS32 antenna measurement software from Rohde & Schwarz. The R&S ATS1000 antenna test system is a compact and mobile shielded chamber solution for OTA and antenna measurements, ideal for 5G mmWave applications. To cover the D-Band frequencies, extensions from Radiometer Physics GmbH, a Rohde & Schwarz company, are used in the setup, which allow direct frequency conversion at the
    probe in both transmit and receive directions. No mechanical modifications or additional RF cabling to the antenna test system is necessary. The setup can measure the amplitude and phase coherent response of a DUT radiating in the D-Band. Fully automated 3D-pattern measurements including post-processing can be performed in short time thanks to the R&S AMS32 software options for nearfield to farfield transformation and the highly accurate precision positioner.

    IHP provided four different devices under test (DUT), based on the same D-Band radar transceiver chipset but with different antenna structures, including on-chip single and stacked patches with air trenches and an on-chip antenna array. The over-the-air characterization verified the wider bandwidth provided by the stacked patches than that by the single patch.

    The performance of the various DUTs was characterized by spherical measurements, using two different setups. By increasing the angular theta step-size from 1 degree to 5 degree, the total test times for a DUT could be reduced from 70 minutes to 12 minutes. By comparing the different DUT designs based on the obtained measurement data, researchers of IHP were able to analyze the effect of the finite on-board reflector area on the radar sensor FoV (field-of-view).

    Prof. Gerhard Kahmen, Managing Director of IHP, says: “Sub-THz frequency systems are getting more and more attention in research and many fields of application. The Rohde & Schwarz OTA test system, extended to D-Band, provides an excellent way to characterize radiation patterns of the complex antenna structures, 1/3 realized in our D-Band radar chips, in a time efficient and precise way. For IHP, these measurements are valuable to understand the physics of the antenna structures and to further improve their performance. The very successful cooperation with an industrial partner leading in the field of wireless and mmWave communication shows the benefit of close interaction between research and application.”

    Alexander Pabst, Vice President of Systems & Projects at Rohde & Schwarz says: “We are excited to work with such an excellent partner as Innovations for High Performance Microelectronics on advancing our industry-leading test solutions for over-the-air testing. These joint efforts will help researchers and key industry players to test and characterize antenna systems and transceiver modules for future automotive radar applications and wireless communication standard, that we eventually call 6G.”

    For further information, visit www.rohde-schwarz.com

     

     

    ELE Times Bureau
    ELE Times Bureauhttps://www.eletimes.ai/
    ELE Times provides a comprehensive global coverage of Electronics, Technology and the Market. In addition to providing in depth articles, ELE Times attracts the industry’s largest, qualified and highly engaged audiences, who appreciate our timely, relevant content and popular formats. ELE Times helps you build awareness, drive traffic, communicate your offerings to right audience, generate leads and sell your products better.

    LEAVE A REPLY

    Please enter your comment!
    Please enter your name here

    Related News

    Must Read

    The Invisible Hand: How Smart Technology Reshaped the RF and Microwave Development Track

    The world is not just connected; it is smart,...

    Nuvoton Technology Launches NuMicro M5531 Series Microcontrollers

    Nuvoton Technology announced the launch of NuMicro M5531 series...

    STMicroelectronics empowers data-hungry industrial transformation with unique dual-range motion sensor

    STMicroelectronics has revealed the ISM6HG256X, a tiny three-in-one motion...

    How AI Is Powering the Road to Level 4 Autonomous Driving

    Courtesy: Nvidia When the Society of Automotive Engineers established its...

    Revolutionizing System Design with AI-Powered Real-Time Simulation

    Courtesy: Cadence The rising demand for AI infrastructure is driving...

    Microchip Technology Expands its India Footprint with a New Office Facility in Bengaluru

    Microchip Technology has expanded its India footprint with the...

    How Quantum Sensors and Post-Moore Measurement Tech Are Rewriting Reality

    When the chip industry stopped promising effortless doublings every...

    Rohde & Schwarz Mobile Test Summit 2025 on the future of wireless communications

    Rohde & Schwarz has announced that this year’s Mobile...